EDN

Testing the limits of organic electronics

The testing and characterization of organic electronic devices is becoming an increasingly important aspect of this growing sector, and the United Kingdom’s National Physical Laboratory (NPL) is ...
SpaceNews

Microgravity Testing Advances Space-Based Printing of Electronics

Space Foundry printed electrodes that could be used in space-based biological and chemical sensors on parabolic flights in Nov. and Dec. 2021 and June 2022. As NASA prepares to send astronauts back to ...
Electronic Design

Part average testing’s popularity grows in the semiconductor industry

Semiconductor fabs—among the most heavily instrumented manufacturing facilities in today’s industrial landscape—continue to grow and generate data throughout the manufacturing process, making the term ...
Semiconductor Engineering

Part Average Testing (PAT)

Part Average Testing, or PAT, is used for outlier detection for a single measurement, a requirement for automotive electronics, found in the Automotive Electronics Councils‘ AEC – Q001 Rev-D ...
EDN

Part Average Testing finds and rejects outlier ICs

ICs for automotive applications must satisfy long-term reliability requirements by being insensitive to hard electromechanical stresses. Recently, some studies revealed that the long term robustness ...
Electronic Design

Simple, Low-Cost Dynamometer Setup for Motor Testing (Part 1)

A dynamometer is a testing device that helps engineers collect data for various mechanical loading conditions that a motor or engine might encounter in a particular application. Other than testing the ...