Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
Author Dr. R. Russell Rhinehart discusses his new book, Nonlinear Model-Based Control: Using First-Principles Models in Process Control, and explains why nonlinear first-principles models should be ...
Control charts have two general uses in an improvement project. Undeniably, the most common application is as a tool to monitor process stability and control. A less common, although some might argue ...
The lower fuselage half of the Multifunctional Fuselage Demonstrator (MFFD) being assembled at SAM|XL, shown here with conduction-welded stringers and ultrasonic spot-welded clips. Photo Credit: ...
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